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The Heated Electrical Intensity Test Meter Controlled by the Microcomputer
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TP274

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    Abstract:

    In this paper, we present a heated electrical intensity test meter controlled by the single chip computer MCS51, and describe the principle of the 90 degree phase transfering method and the LEM module. The hardware schematics of the system are implemen

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Ji Zhicheng Dai Yueming Sun Xinhai. The Heated Electrical Intensity Test Meter Controlled by the Microcomputer[J]. Journal of Food Science and Biotechnology,1998,17(3).

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